Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/1212
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dc.contributor.authorLEAHU, Alexeien_US
dc.contributor.authorANDRIEVSCHI-BAGRIN, Veronicaen_US
dc.contributor.authorCIORBA, Dumitruen_US
dc.contributor.authorFIODOROV Ionen_US
dc.date.accessioned2022-05-05T10:29:33Z-
dc.date.available2022-05-05T10:29:33Z-
dc.date.issued2021-
dc.identifier.urihttp://cris.utm.md/handle/5014/1212-
dc.description.abstractThe paper addresses the issue of comparing the reliability of two standard types of networks: serial- parallel and parallel-serial. Four variants of dynamic mathematical models are analyzed depending on the lifetime cumulative distribution function of each units of the network, the non-random / random character of the number of units in each subnet and of the number of subnets. Sufficient conditions have been determined for serial- parallel networks to be more reliable than parallel-serial networks. The main result is that these conditions do not imply the lifetime distribution of each unit but only the probabilistic distribution of the numbers of units and subsystems of the networks.en_US
dc.language.isoenen_US
dc.subjectlifetime distributionen_US
dc.subjectreliabilityen_US
dc.subjectpower series distributionen_US
dc.subjectserial-parallel/parallel-serial networksen_US
dc.titleOnce again about the reliability of serial-parallel networks vs parallel-serial networksen_US
dc.typeArticleen_US
dc.relation.conferenceThe 11th International Conference on Electronics, Communications and Computingen_US
dc.identifier.doihttps://doi.org/10.52326/ic-ecco.2021/CS.02-
item.grantfulltextopen-
item.languageiso639-1other-
item.fulltextWith Fulltext-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.deptTechnical University of Moldova-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.orcid0000-0002-1670-0111-
crisitem.author.orcid0000-0002-3157-5072-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
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