Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/148
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dc.contributor.authorZALAMAI, Victoren_US
dc.contributor.authorSIRBU, Nicolaeen_US
dc.contributor.authorTIRON, Andreien_US
dc.date.accessioned2020-03-11T13:36:17Z-
dc.date.available2020-03-11T13:36:17Z-
dc.date.issued2019-04-24-
dc.identifier.citationTY - JOUR AU - Syrbu, Nicolai AU - Tiron, A. AU - Zalamai, Victor PY - 2019/04/09 SP - T1 - Electronic and optical properties of HgIn2S4 thiospinels VL - 6 DO - 10.1088/2053-1591/ab17b0 JO - Materials Research Express ER -en_US
dc.identifier.issn2053-1591-
dc.identifier.urihttp://cris.utm.md/handle/5014/148-
dc.description.abstractPhotoluminescence ( PL ), transmission ( T ), reflection ( R ), wavelength modulated transmission (Δ T/ Δ λ ) and reflection (Δ R/ Δ λ ) spectra of thiospinel HgIn 2 S 4 crystals were investigated in temperature interval form 10 to 300 K. The band gap 1.64 eV (300 K) and 1.666 eV (10 K) are formed by electron transitions from L to Γ points of Brillouin zone. The edge temperature shift coefficient β (Δ E g / Δ T ) is equal to 4.3 10 ⁻³ eV K ⁻¹ . The direct energy gap in Γ point ( E gdir ) corresponds to 1.748 eV. The top valence bands in k =0 are split by the crystal field on 25 meV. Direct electron transitions a1-a7, observed in energy range 1-6 eV, were interpreted conform the theoretically calculated band structure. The optical functions ( n , k, ϵ 1 and ϵ 2 ) were determined by Kramers-Kronig analysis.en_US
dc.language.isoenen_US
dc.relation.ispartofMATERIALS RESEARCH EXPRESSen_US
dc.titleElectronic and optical properties of HgIn2S4 thiospinelsen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/2053-1591/ab17b0-
item.grantfulltextopen-
item.fulltextWith Fulltext-
item.languageiso639-1other-
crisitem.author.deptDepartment of Microelectronics and Biomedical Engineering-
crisitem.author.deptDepartment of Telecommunications and Electronic Systems-
crisitem.author.orcid0000-0002-1882-2622-
crisitem.author.orcid0000-0001-6800-8111-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
crisitem.author.parentorgFaculty of Electronics and Telecommunications-
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