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Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/1897
DC FieldValueLanguage
dc.contributor.authorZALAMAI, Victoren_US
dc.contributor.authorTIRON, Andreien_US
dc.contributor.authorCristea, E.en_US
dc.contributor.authorRusu, E. V.en_US
dc.date.accessioned2023-11-20T20:14:51Z-
dc.date.available2023-11-20T20:14:51Z-
dc.date.issued2022-
dc.identifier.citationZALAMAI, V.V., TIRON, A.V., CRISTEA, E., RUSU, E.V. Interference of additional waves of excitonic polaritons in SnSe single crystals. International Scientific Conference “Materials and Structures of Modern Electronics” MSME-2022, 12 — 14 October 2022, Minsk, Belarus. ISBN 978-985-881-440-3en_US
dc.identifier.isbn978-985-881-440-3-
dc.identifier.urihttp://cris.utm.md/handle/5014/1897-
dc.description.abstractAbsorption, reflection, photoluminescence, wavelength modulation reflection and transmission spectra at temperatures 300–10 K in energy rage 1.1–1.5 eV were investigated. Contours of excitonic reflection spectra were calculated and the binding energy (Rydberg constant), translation (M) and reduced (µ *) effective masses of excitons were determined. Effective masses of electrons and holes were estimated. In the region of A and B excitonic series sparse and thick interference fringes were observed in measured spectra. The sparse fringes are due to Fabry-Perot interference of excitonic polaritons of lower polaritonic branch (ωT). The thick interference is caused by the mutual interference of excitonic polaritons of lower (ωT) and upper (ωL) polaritonic branchesen_US
dc.language.isoenen_US
dc.relation20.80009.5007.20en_US
dc.relation22.80013.5007.4BLen_US
dc.subjecttinmonoselenideen_US
dc.subjectoptical spectroscopyen_US
dc.subjectexcitonic polaritonsen_US
dc.subjectelectron transitionsen_US
dc.subjectdirect transitionsen_US
dc.titleInterference of additional waves of excitonic polaritons in SnSe single crystalsen_US
dc.typeArticleen_US
dc.relation.conferenceMaterials and Structures of Modern Electronicsen_US
item.grantfulltextopen-
item.languageiso639-1other-
item.fulltextWith Fulltext-
crisitem.author.deptDepartment of Microelectronics and Biomedical Engineering-
crisitem.author.orcid0000-0002-1882-2622-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
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