Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/2047
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dc.contributor.authorIAPĂSCURTĂ, Victoren_US
dc.contributor.authorFIODOROV Ionen_US
dc.date.accessioned2023-11-29T15:14:09Z-
dc.date.available2023-11-29T15:14:09Z-
dc.date.issued2022-
dc.identifier.citationIAPĂSCURTĂ, Victor, FIODOROV, Ion. Kolmogorov-Chaitin Algorithmic Complexity for EEG Analysis. In: Electronics, Communications and Computing, Ed. 12, 20-21 octombrie 2022, Chişinău. Chișinău: Tehnica-UTM, 2023, Editia 12, pp. 214-218. DOI: 10.52326/ic-ecco.2022/CS.14en_US
dc.identifier.urihttp://cris.utm.md/handle/5014/2047-
dc.description.abstractElectroencephalography as a generally accepted method of monitoring the electrical activity of brain neurons is widely used both in diseases and in healthy conditions. The recorded electrical signal is usually obtained from several electrodes located on the scalp. While EEG recording techniques are largely standardized, the interpretation of some aspects is still an open question. There is hardly questionable progress in detecting abnormal EEG signals known as seizures. A less explored field is the detection and classification of non-pathological conditions such as emotional and other functional states of the brain. This requires special approaches and techniques that have been widely developed over the past decade. The current paper describes an attempt to use algorithmic complexity concepts and tools for EEG transformation making it possible to combine this approach and machine learning for classification purposes.en_US
dc.language.isoenen_US
dc.subjectelectroencephalographyen_US
dc.subjectEEG analysisen_US
dc.subjectalgorithmic complexityen_US
dc.subjectBlock decomposition methoden_US
dc.subjectmachine learningen_US
dc.titleKolmogorov-Chaitin Algorithmic Complexity for EEG Analysisen_US
dc.typeArticleen_US
dc.relation.conferenceElectronics, Communications and Computingen_US
dc.identifier.doi10.52326/ic-ecco.2022/CS.14-
item.grantfulltextopen-
item.languageiso639-1other-
item.fulltextWith Fulltext-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
Appears in Collections:Proceedings Papers
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