Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/2293
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dc.contributor.authorLUPAN, Cristianen_US
dc.contributor.authorBÎRNAZ, Adrianen_US
dc.contributor.authorBUZDUGAN, Arturen_US
dc.contributor.authorZIMOCH, Lukasen_US
dc.contributor.authorADELUNG, Raineren_US
dc.contributor.authorLUPAN, Olegen_US
dc.date.accessioned2023-12-16T18:04:45Z-
dc.date.available2023-12-16T18:04:45Z-
dc.date.issued2022-
dc.identifier.citationLUPAN, Cristian, BÎRNAZ, Adrian, BUZDUGAN, Artur, ZIMOCH, Lukas, ADELUNG, Rainer, LUPAN, Oleg. The Reliability to Gamma Radiation of Gas Sensors Based on Nanostructured ZnO:Eu. In: Electronics, Communications and Computing, Ed. 12, 20-21 octombrie 2022, Chişinău. Chișinău: Tehnica-UTM, 2023, Editia 12, pp. 69-72. DOI: https://doi.org/10.52326/ic-ecco.2022/EL.01en_US
dc.identifier.urihttp://cris.utm.md/handle/5014/2293-
dc.description.abstractIn this work it was investigated the reliability to ionizing radiation of Eu-doped ZnO nanostructured films functionalized with Pd. Morphological, sensorial and electrical properties of sensors were studied initially, after irradiation and after 6 months to observe the influence of irradiation.en_US
dc.language.isoenen_US
dc.subjectgas sensorsen_US
dc.subjectZnOen_US
dc.subjectEu dopingen_US
dc.subjectgamma irradiationen_US
dc.subjectreliabilityen_US
dc.titleThe Reliability to Gamma Radiation of Gas Sensors Based on Nanostructured ZnO:Euen_US
dc.typeArticleen_US
dc.relation.conferenceElectronics, Communications and Computingen_US
dc.identifier.doi10.52326/ic-ecco.2022/EL.01-
item.grantfulltextopen-
item.fulltextWith Fulltext-
item.languageiso639-1other-
crisitem.author.deptDepartment of Microelectronics and Biomedical Engineering-
crisitem.author.deptDepartment of Microelectronics and Biomedical Engineering-
crisitem.author.orcid0000-0002-7913-9712-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
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