Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/379
DC FieldValueLanguage
dc.contributor.authorANDRIEVSCHI-BAGRIN, Veronicaen_US
dc.date.accessioned2020-04-12T16:20:36Z-
dc.date.available2020-04-12T16:20:36Z-
dc.date.issued2019-
dc.identifier.citationANDRIEVSCHI-BAGRIN, Veronica. Modelling reliability of serial-parallel and parallel-serial networks with constant numbers of subnetworks and units. In: Electronics, Communications and Computing. Editia a 10-a, 23-26 octombrie 2019, Chişinău. Chișinău, Republica Moldova: Universitatea Tehnică a Moldovei, 2019, p. 43. ISBN 777978-9975-108-84-3.en_US
dc.identifier.isbn978-9975-108-84-3-
dc.identifier.urihttp://repository.utm.md/handle/5014/5900-
dc.identifier.urihttp://cris.utm.md/handle/5014/379-
dc.description.abstractOn the basis of dynamic mathematical models, a comparative analysis of the reliability of two types of networks (serial-parallel and parallel-serial) is performed in our paper. Cases are analyzed when the numbers of sub-networks and units each sub-network are constants, but also when the lifetimes of all units are independent, identically distributed random variables (i.i.d.r.v.). The formulas for calculating the reliability of the related networks are deduced. The invoked examples show us that Reliability of Serial-Parallel Networks versus Parallel-Serial Networks depends only of number of the sub-networks and number of units in the sub-networks.en_US
dc.language.isoenen_US
dc.subjectlifetime distributionsen_US
dc.subjectsurvival functionsen_US
dc.subjectserial-parallel and parallel serial networksen_US
dc.titleModelling reliability of serial-parallel and parallel-serial networks with constant numbers of subnetworks and unitsen_US
dc.typeArticleen_US
dc.relation.conferenceElectronics, Communications and Computingen_US
item.grantfulltextopen-
item.languageiso639-1other-
item.fulltextWith Fulltext-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
Appears in Collections:Conference Abstracts
Files in This Item:
File Description SizeFormat
Conf_IC_ECCO_2019_pg43.pdf294.11 kBAdobe PDFView/Open
Show simple item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.