CRIS of TUM
Current Research Information System (CRIS) of the Technical University of Moldova (TUM) is an open access system gathering information and digital material relating to the various research and innovation entities and activities of TUM: researchers, research units, publications, patents, thesis, awards, events, equipment, services and other.
Please use this identifier to cite or link to this item:
http://cris.utm.md/handle/5014/400| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEAHU, Alexei | en_US |
| dc.contributor.author | ANDRIEVSCHI-BAGRIN, Veronica | en_US |
| dc.date.accessioned | 2020-04-12T17:33:27Z | - |
| dc.date.available | 2020-04-12T17:33:27Z | - |
| dc.date.issued | 2019 | - |
| dc.identifier.citation | LEAHU, Alexei; ANDRIEVSCHI-BAGRIN, Veronica. Reliability of serial-parallel networks vs reliability of parallel-serial networks. In: Electronics, Communications and Computing. Editia a 10-a, 23-26 octombrie 2019, Chişinău. Chișinău, Republica Moldova: Universitatea Tehnică a Moldovei, 2019, p. 45. ISBN 978-9975-108-84-3. | en_US |
| dc.identifier.isbn | 978-9975-108-84-3 | - |
| dc.identifier.uri | http://cris.utm.md/handle/5014/400 | - |
| dc.description.abstract | In our paper we introduce some dynamic mathematical models to perform a comparative analysis of the reliability of two types of networks: serial-parallel and parallelserial. Cases are analyzed when the number of sub-networks and the number of units in each sub-network are Power Series Distributed (PSD) random variables (r.v.), but also when lifetimes are independent, identically distributed r.v. The formulas for calculating the reliability of the related networks it was deduced. Some examples are analyzed grafically. | en_US |
| dc.language.iso | en | en_US |
| dc.subject | lifetime distributions | en_US |
| dc.subject | survival functions | en_US |
| dc.subject | PSD distributions | en_US |
| dc.subject | serial-parallel and parallel-serial networks | en_US |
| dc.title | Reliability of serial-parallel networks vs reliability of parallel-serial networks | en_US |
| dc.type | Article | en_US |
| dc.relation.conference | Electronics, Communications and Computing | en_US |
| item.grantfulltext | open | - |
| item.fulltext | With Fulltext | - |
| item.languageiso639-1 | other | - |
| crisitem.author.dept | Department of Software Engineering and Automatics | - |
| crisitem.author.dept | Department of Software Engineering and Automatics | - |
| crisitem.author.orcid | 0000-0002-1670-0111 | - |
| crisitem.author.parentorg | Faculty of Computers, Informatics and Microelectronics | - |
| crisitem.author.parentorg | Faculty of Computers, Informatics and Microelectronics | - |
| Appears in Collections: | Conference Abstracts | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 45-45_8.pdf | 264.76 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.