Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/495
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dc.contributor.authorDOROGAN, Andreien_US
dc.contributor.authorBERIL, Stephanen_US
dc.contributor.authorSTAMOV, Ivanen_US
dc.contributor.authorSIRBU, Nicolaeen_US
dc.date.accessioned2020-05-23T18:34:53Z-
dc.date.available2020-05-23T18:34:53Z-
dc.date.issued2020-
dc.identifier.citationDorogan A.V., Beril S.I., Stamov I.G., Syrbu N.N. (2020) Me-ZnP2 Diodes Sensible to Optical Gyration. In: Tiginyanu I., Sontea V., Railean S. (eds) 4th International Conference on Nanotechnologies and Biomedical Engineering. ICNBME 2019. IFMBE Proceedings, vol 77. Springer, Chamen_US
dc.identifier.isbn978-3-030-31866-6-
dc.identifier.isbn978-3-030-31865-9-
dc.identifier.issn1680-0737-
dc.identifier.urihttp://cris.utm.md/handle/5014/495-
dc.description.abstractSpatial dispersion in ZnP2-D 4 8 has been studied. The spectral dependences of the refractive index nc(Eǁc, kǁa), na(Eǁa, kǁc) and nb(Eǁb, kǁc) had been determined. It was shown that the dispersion is positive nc(Eǁc, kǁa), na(Eǁa, kǁc) > nb(Eǁb, kǁc) in λ > λ0 region, the dispersion is negative nc(Eǁc, kǁa) at λ < λ0, and Δn = nc – nb= 0 at λ = λ0. The LIV characteristics of Me-ZnP2-D 4 8 diodes had been studied at different temperatures, the temperature dependences of the “imperfection” factor δ for different Schottky barriers. Capacitance voltage characteristics of Me-ZnP2-D 4 8 photodiodes obtained by electrochemical deposition of metal and by thermo-chemical spraying in vacuum had been studied. The influence of birefringence and gyration on spectral characteristics of p-n photodiodes and Schottky diodes had been revealed. The ability of controlling photodiodes’ characteristics was obtained using the gyration particularities in ZnP2-D 4 8 crystals.en_US
dc.language.isoenen_US
dc.publisherSpringer, Chamen_US
dc.relation.ispartofIFMBE Proceedingsen_US
dc.subjectschottky diodesen_US
dc.subjectoptical gyrationen_US
dc.subjectanisotropyen_US
dc.titleMe-ZnP2 Diodes Sensible to Optical Gyrationen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/978-3-030-31866-6_34-
dc.identifier.scopus2-s2.0-85075593845-
item.fulltextWith Fulltext-
item.languageiso639-1other-
item.grantfulltextopen-
crisitem.author.deptDepartment of Telecommunications and Electronic Systems-
crisitem.author.deptDepartment of Telecommunications and Electronic Systems-
crisitem.author.orcid0000-0001-6800-8111-
crisitem.author.parentorgFaculty of Electronics and Telecommunications-
crisitem.author.parentorgFaculty of Electronics and Telecommunications-
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