Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/559
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dc.contributor.authorTIULEANU, Dumitruen_US
dc.contributor.authorCIOBANU, M.en_US
dc.date.accessioned2020-07-28T12:25:07Z-
dc.date.available2020-07-28T12:25:07Z-
dc.date.issued2020-
dc.identifier.citationTSIULYANU, D.; CIOBANU, M. Using the impedance spectroscopy for investigation of aging, thermal and adsorption properties of glassy chalcogenide films, Abstracts book of the Fifth International Symposium on Dielectric Materials and Applications ISyDMA’5, Marrakech (Morocco) 2020, pp.71-72.en_US
dc.identifier.urihttp://cris.utm.md/handle/5014/559-
dc.description.abstractThe work is dedicated to application of the method of impedance spectroscopy [1] to provide evidence and investigation of effects of aging, annealing, temperature and gas adsorption in chalcogenide based thin films.en_US
dc.language.isoenen_US
dc.relation20.80009.5007.21. Calcogenuri sticloase cu reţele spaţiale autoorganizate pentru bioinginerieen_US
dc.subjectchalcogenide filmsen_US
dc.subjectimpedanceen_US
dc.subjectagingen_US
dc.subjectannealingen_US
dc.subjectadsorptionen_US
dc.titleUsing the impedance spectroscopy for investigation of aging, thermal and adsorption properties of glassy chalcogenide filmsen_US
dc.typeArticleen_US
dc.relation.conferenceISyDMA'5en_US
item.fulltextWith Fulltext-
item.languageiso639-1other-
item.grantfulltextopen-
crisitem.project.grantno20.80009.5007.21-
crisitem.project.fundingProgramState Programme-
crisitem.author.deptDepartment of Physics-
crisitem.author.orcid0000-0003-3711-4434-
crisitem.author.parentorgFaculty of Electronics and Telecommunications-
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