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Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/560
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dc.contributor.authorTIULEANU, Dumitruen_US
dc.contributor.authorCIOBANU, Marinaen_US
dc.contributor.authorMOCREAC, Olgaen_US
dc.date.accessioned2020-07-28T12:40:48Z-
dc.date.available2020-07-28T12:40:48Z-
dc.date.issued2020-
dc.identifier.citationTSIULYANU, D.; CIOBANU, M. MOCREAC, O. Effect of nanostructuring to response kinetics of tellurium thin films by nitrogen dioxide sensing, Abstracts book of the XII International Conference "Electronic Processes in Organic and Inorganic Materials” (ICEPOM-12), Kamianets-Podlskyi, Ukraine, 2020, p.86.en_US
dc.identifier.urihttp://cris.utm.md/handle/5014/560-
dc.description.abstractThe work is conducted to clarify the effect ofstructural dimensionality of tellurium thin films on gas (NO2) sensing at room temperature.en_US
dc.language.isoenen_US
dc.relation20.80009.5007.21. Calcogenuri sticloase cu reţele spaţiale autoorganizate pentru bioinginerieen_US
dc.titleEffect of nanostructuring to response kinetics of tellurium thin films by nitrogen dioxide sensingen_US
dc.typeArticleen_US
dc.relation.conferenceICEPOM-12en_US
item.grantfulltextopen-
item.fulltextWith Fulltext-
item.languageiso639-1other-
crisitem.project.grantno20.80009.5007.21-
crisitem.project.fundingProgramState Programme-
crisitem.author.deptDepartment of Physics-
crisitem.author.deptDepartment of Physics-
crisitem.author.orcid0000-0003-3711-4434-
crisitem.author.orcid0000-0002-4362-4556-
crisitem.author.parentorgFaculty of Electronics and Telecommunications-
crisitem.author.parentorgFaculty of Electronics and Telecommunications-
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