Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/641
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dc.contributor.authorLEAHU, Alexeien_US
dc.contributor.authorANDRIEVSCHI-BAGRIN, Veronicaen_US
dc.date.accessioned2020-12-23T13:19:01Z-
dc.date.available2020-12-23T13:19:01Z-
dc.date.issued2020-
dc.identifier.citationLeahu, A., & Andrievschi-Bagrin, V. (2020). Lifetime Distributions and their Approximation in Reliability of Serial/Parallel Networks, Analele Universitatii "Ovidius" Constanta - Seria Matematica, 28(2), 161-172. doi: https://doi.org/10.2478/auom-2020-0025en_US
dc.identifier.issn1844-0835-
dc.identifier.urihttp://cris.utm.md/handle/5014/641-
dc.description.abstractIn this paper we present limit theorems for lifetime distributions connected with network’s reliability as distributions of random variables(r.v.) min(Y1, Y2,..., YM) and max(Y1, Y2,..., YM ), where Y1, Y2,..., are independent, identically distributed random variables (i.i.d.r.v.), M being Power Series Distributed (PSD) r.v. independent of them and, at the same time, Yk, k = 1, 2, ..., being a sum of non-negative, i.i.d.r.v. in a Pascal distributed random number.en_US
dc.language.isoenen_US
dc.relation.ispartofAnalele Universitatii "Ovidius" Constanta - Seria Matematicaen_US
dc.subjectlifetime distributionsen_US
dc.subjectsurvival functionsen_US
dc.subjectPSD distributionsen_US
dc.subjectseries and parallel network systemsen_US
dc.subjectPrimary 60E05, 60F05en_US
dc.subjectSecondary 62P30en_US
dc.titleLifetime Distributions and their Approximation in Reliability of Serial/Parallel Networksen_US
dc.typeArticleen_US
dc.identifier.doi10.2478/auom-2020-0025-
item.grantfulltextopen-
item.fulltextWith Fulltext-
item.languageiso639-1other-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.orcid0000-0002-1670-0111-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
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