Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/754
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dc.contributor.authorCOLIBABA, Gleben_US
dc.contributor.authorRUSNAC, Dumitruen_US
dc.contributor.authorFEDOROV, Vladimiren_US
dc.contributor.authorPETRENKO, Peteren_US
dc.contributor.authorMONAICO, Eduarden_US
dc.date.accessioned2021-06-25T11:44:28Z-
dc.date.available2021-06-25T11:44:28Z-
dc.date.issued2021-
dc.identifier.citationG.V. Colibaba, D. Rusnac, V. Fedorov, P. Petrenko, E.V. Monaico, Low-temperature sintering of highly conductive ZnO:Ga:Cl ceramics by means of chemical vapor transport, Journal of the European Ceramic Society, Volume 41, Issue 1, 2021, pp. 443-450, ISSN 0955-2219, https://doi.org/10.1016/j.jeurceramsoc.2020.08.002.en_US
dc.identifier.urihttp://cris.utm.md/handle/5014/754-
dc.descriptionVolume 41, Issue 1, January 2021, Pages 443-450en_US
dc.description.abstractA new technology for sintering a ZnO + Ga2O3 powder via chemical vapor transport based on HCl has been developed. The proposed sintering method has the following advantages: a low sintering temperature of 1000–1100 °C, there is no need to use of expensive dopant nanopowders, the possibility of multiple re-sintering, and the absence of changes in the diameter of the ceramics after sintering. A ZnO:Ga:Cl ceramics with a density of 5.31 g/cm3, a hardness of 2.0 GPa, and a resistivity of 1.46 × 10–3 Ω⋅cm has been synthesized. The solubility limit of the Ga2O3 dopant has been estimated at about 3 mol %. At a higher doping level, the content of the ZnGa2O4 spinel phase becomes significant. In addition, ZnO:Ga:Cl thin films with a resistivity of 2.77 × 10–4 Ω⋅cm can be grown by DC magnetron sputtering of the synthesized ceramics.en_US
dc.language.isoenen_US
dc.relation.ispartofJournal of the European Ceramic Societyen_US
dc.subjectHalide vapor transporten_US
dc.subjectzinc oxideen_US
dc.subjectHighly conductive ceramicsen_US
dc.subjectDoping by GaZnOen_US
dc.subjectThin filmsen_US
dc.titleLow-temperature sintering of highly conductive ZnO:Ga:Cl ceramics by means of chemical vapor transporten_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.jeurceramsoc.2020.08.002-
item.grantfulltextopen-
item.languageiso639-1other-
item.fulltextWith Fulltext-
crisitem.author.deptDepartment of Microelectronics and Biomedical Engineering-
crisitem.author.orcid0000-0003-3293-8645-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
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