Parallel data processing for PCB testing

Abstract

PCBs (Printed Circuit Board) inspection and testing requires an analysis of some performance criteria for the data acquisition and processing system. These criteria are determined by the physical properties of the processes, which determine the concurrent propagation of the signals in the PCBs [1] and requires their acquisition and parallel processing [2]. In this case it is necessary to apply the methods and models of concurrent processing of multidimensional digital signals [3]. The major issue in the development of PCB testing systems is the spatial and time synchronization of data acquisition and processing [1, 2]. This problem can be solved by developing new discretization and signal acquisition methods and new mathematical models for their processing.