Please use this identifier to cite or link to this item:
http://cris.utm.md/handle/5014/482
DC Field | Value | Language |
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dc.contributor.author | TIRON, Andrei | en_US |
dc.date.accessioned | 2020-05-22T11:53:05Z | - |
dc.date.available | 2020-05-22T11:53:05Z | - |
dc.date.issued | 2020 | - |
dc.identifier.citation | Tiron A.V. (2020) Refractive Index in the Region of Excitonic Resonances in TlGaSe2 Crystals. In: Tiginyanu I., Sontea V., Railean S. (eds) 4th International Conference on Nanotechnologies and Biomedical Engineering. ICNBME 2019. IFMBE Proceedings, vol 77. Springer, Cham | en_US |
dc.identifier.isbn | 978-303031865-9 | - |
dc.identifier.isbn | 978-3-030-31866-6 | - |
dc.identifier.issn | 1680-0737 | - |
dc.identifier.uri | http://cris.utm.md/handle/5014/482 | - |
dc.description.abstract | The low-temperature transmission and wavelength modulated transmission spectra of TlGaSe2 crystals with a thickness of 7, 5.7, 4.7 μm were measured. Refractive index was calculated from interference observed in transmission spectra. The spectral dependences of the normal dispersion na (E║a) and nв (E║в) and Δn = na (E║a) − nв (E║в) on the long-wavelength and short-wave side of the ground states A, B and C of excitons are determined. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Springer | en_US |
dc.relation.ispartof | IFMBE Proceedings | en_US |
dc.subject | chalcogenide | en_US |
dc.subject | optical spectroscopy | en_US |
dc.subject | refractive index | en_US |
dc.title | Refractive index in the region of excitonic resonances in TLGase2 Crystals | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1007/978-3-030-31866-6_16 | - |
dc.identifier.scopus | 2-s2.0-85075604705 | - |
item.grantfulltext | open | - |
item.languageiso639-1 | other | - |
item.fulltext | With Fulltext | - |
Appears in Collections: | Conference Abstracts |
Files in This Item:
File | Description | Size | Format | |
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Refractive_index_TIRON_A_V.pdf | 22.59 kB | Adobe PDF | View/Open |
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