Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/482
Title: Refractive index in the region of excitonic resonances in TLGase2 Crystals
Authors: TIRON, Andrei 
Keywords: chalcogenide;optical spectroscopy;refractive index
Issue Date: 2020
Publisher: Springer
Source: Tiron A.V. (2020) Refractive Index in the Region of Excitonic Resonances in TlGaSe2 Crystals. In: Tiginyanu I., Sontea V., Railean S. (eds) 4th International Conference on Nanotechnologies and Biomedical Engineering. ICNBME 2019. IFMBE Proceedings, vol 77. Springer, Cham
Journal: IFMBE Proceedings 
Abstract: 
The low-temperature transmission and wavelength modulated transmission spectra of TlGaSe2 crystals with a thickness of 7, 5.7, 4.7 μm were measured. Refractive index was calculated from interference observed in transmission spectra. The spectral dependences of the normal dispersion na (E║a) and nв (E║в) and Δn = na (E║a) − nв (E║в) on the long-wavelength and short-wave side of the ground states A, B and C of excitons are determined.
URI: http://cris.utm.md/handle/5014/482
ISBN: 978-303031865-9
978-3-030-31866-6
ISSN: 1680-0737
DOI: 10.1007/978-3-030-31866-6_16
Appears in Collections:Conference Abstracts

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