Please use this identifier to cite or link to this item: http://cris.utm.md/handle/5014/2243
DC FieldValueLanguage
dc.contributor.authorVERJBITCHII, V.en_US
dc.contributor.authorMARTINIUC Alexeien_US
dc.date.accessioned2023-12-10T00:14:21Z-
dc.date.available2023-12-10T00:14:21Z-
dc.date.issued2022-
dc.identifier.citationVERJBITCHII, V., MARTÎNIUC, Alexei. The method of measuring the parameters of nanostructured sensors. In: Electronics, Communications and Computing, Ed. 12, 20-21 octombrie 2022, Chişinău. Chișinău: Tehnica-UTM, 2023, Editia 12, pp. 94-97. DOI: 10.52326/ic-ecco.2022/EL.06en_US
dc.identifier.urihttp://cris.utm.md/handle/5014/2243-
dc.description.abstractIn this paper, the data obtained from the research on the development of methods for measuring the parameters of nanostructured sensors, which is based on the use of 2 amplifiers and 2 analog-digital converters for measuring the voltages at the reference voltage source and the voltage drop on the additional resistor, which eliminates the shunt effect of the resistance of the structures investigated by the resistance input of the amplifier.en_US
dc.language.isoenen_US
dc.relation20.80009.5007.09. Elaborarea şi lansarea seriei de nanosateliţi cu misiuni de cercetare de pe Staţia Spaţială Internaţională, monitorizarea, postoperarea lor şi promovarea tehnologiilor spaţiale / Development and launch of the series of nanosatellites with research missions on the International Space Station, monitoring, postoperating and promoting space technologiesen_US
dc.subjectnanostructured sensorsen_US
dc.subjectreference voltageen_US
dc.subjectinput impedanceen_US
dc.titleThe method of measuring the parameters of nanostructured sensorsen_US
dc.typeArticleen_US
dc.relation.conferenceElectronics, Communications and Computingen_US
dc.identifier.doi10.52326/ic-ecco.2022/EL.06-
item.grantfulltextopen-
item.fulltextWith Fulltext-
item.languageiso639-1other-
crisitem.project.grantno20.80009.5007.09-
crisitem.project.fundingProgramState Programme-
crisitem.author.deptDepartment of Software Engineering and Automatics-
crisitem.author.parentorgFaculty of Computers, Informatics and Microelectronics-
Appears in Collections:Conference Abstracts
Files in This Item:
File Description SizeFormat
94-97_47.pdf266.83 kBAdobe PDFView/Open
Show simple item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.