CRIS of TUM
Current Research Information System (CRIS) of the Technical University of Moldova (TUM) is an open access system gathering information and digital material relating to the various research and innovation entities and activities of TUM: researchers, research units, publications, patents, thesis, awards, events, equipment, services and other.
Please use this identifier to cite or link to this item:
http://cris.utm.md/handle/5014/2243| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | VERJBITCHII, V. | en_US |
| dc.contributor.author | MARTINIUC Alexei | en_US |
| dc.date.accessioned | 2023-12-10T00:14:21Z | - |
| dc.date.available | 2023-12-10T00:14:21Z | - |
| dc.date.issued | 2022 | - |
| dc.identifier.citation | VERJBITCHII, V., MARTÎNIUC, Alexei. The method of measuring the parameters of nanostructured sensors. In: Electronics, Communications and Computing, Ed. 12, 20-21 octombrie 2022, Chişinău. Chișinău: Tehnica-UTM, 2023, Editia 12, pp. 94-97. DOI: 10.52326/ic-ecco.2022/EL.06 | en_US |
| dc.identifier.uri | http://cris.utm.md/handle/5014/2243 | - |
| dc.description.abstract | In this paper, the data obtained from the research on the development of methods for measuring the parameters of nanostructured sensors, which is based on the use of 2 amplifiers and 2 analog-digital converters for measuring the voltages at the reference voltage source and the voltage drop on the additional resistor, which eliminates the shunt effect of the resistance of the structures investigated by the resistance input of the amplifier. | en_US |
| dc.language.iso | en | en_US |
| dc.relation | 20.80009.5007.09. Elaborarea şi lansarea seriei de nanosateliţi cu misiuni de cercetare de pe Staţia Spaţială Internaţională, monitorizarea, postoperarea lor şi promovarea tehnologiilor spaţiale / Development and launch of the series of nanosatellites with research missions on the International Space Station, monitoring, postoperating and promoting space technologies | en_US |
| dc.subject | nanostructured sensors | en_US |
| dc.subject | reference voltage | en_US |
| dc.subject | input impedance | en_US |
| dc.title | The method of measuring the parameters of nanostructured sensors | en_US |
| dc.type | Article | en_US |
| dc.relation.conference | Electronics, Communications and Computing | en_US |
| dc.identifier.doi | 10.52326/ic-ecco.2022/EL.06 | - |
| item.grantfulltext | open | - |
| item.languageiso639-1 | other | - |
| item.fulltext | With Fulltext | - |
| crisitem.author.dept | Department of Software Engineering and Automatics | - |
| crisitem.author.parentorg | Faculty of Computers, Informatics and Microelectronics | - |
| crisitem.project.grantno | 20.80009.5007.09 | - |
| crisitem.project.fundingProgram | State Programme | - |
| Appears in Collections: | Conference Abstracts | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 94-97_47.pdf | 266.83 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.