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http://cris.utm.md/handle/5014/2243| Title: | The method of measuring the parameters of nanostructured sensors | Authors: | VERJBITCHII, V. MARTINIUC Alexei |
Keywords: | nanostructured sensors;reference voltage;input impedance | Issue Date: | 2022 | Source: | VERJBITCHII, V., MARTÎNIUC, Alexei. The method of measuring the parameters of nanostructured sensors. In: Electronics, Communications and Computing, Ed. 12, 20-21 octombrie 2022, Chişinău. Chișinău: Tehnica-UTM, 2023, Editia 12, pp. 94-97. DOI: 10.52326/ic-ecco.2022/EL.06 | Project: | 20.80009.5007.09. Elaborarea şi lansarea seriei de nanosateliţi cu misiuni de cercetare de pe Staţia Spaţială Internaţională, monitorizarea, postoperarea lor şi promovarea tehnologiilor spaţiale / Development and launch of the series of nanosatellites with research missions on the International Space Station, monitoring, postoperating and promoting space technologies | Conference: | Electronics, Communications and Computing | Abstract: | In this paper, the data obtained from the research on the development of methods for measuring the parameters of nanostructured sensors, which is based on the use of 2 amplifiers and 2 analog-digital converters for measuring the voltages at the reference voltage source and the voltage drop on the additional resistor, which eliminates the shunt effect of the resistance of the structures investigated by the resistance input of the amplifier. |
URI: | http://cris.utm.md/handle/5014/2243 | DOI: | 10.52326/ic-ecco.2022/EL.06 |
| Appears in Collections: | Conference Abstracts |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| 94-97_47.pdf | 266.83 kB | Adobe PDF | View/Open |
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